Abstract
We compare the results of low-temperature (4.2 K) microphotoluminescence (PL) measurements on cleaved edges of spontaneously ordered GaInP2 alloy samples with the results of cross-section transmission electron microscopy (TEM). The TEM dark-field images show that the size of ordered domains grows as the deposition progresses. The excitonic luminescence peak in the micro-PL spectra of GaInP2 is stronger near the surface of the thin film than near the substrate. From these results, we conclude that there is a direct correlation between the domain size or alternatively, the density of domain boundaries, and the relative strength of the excitonic peak.
Original language | American English |
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Pages (from-to) | 5418-5420 |
Number of pages | 3 |
Journal | Journal of Applied Physics |
Volume | 83 |
Issue number | 10 |
DOIs | |
State | Published - 1998 |
NREL Publication Number
- NREL/JA-590-25658