Abstract
Extraction of diode quality factor and series resistance from current-voltage data may be complicated by voltage drops across the transparent conducting oxide. The effect of the voltage drops on IV analysis is negligible for small cells, but becomes important for larger cells such as those found in thin-film modules. Agreement between predicted and measured voltage drops is demonstrated. Numerical results are presented for CdTe and CuInSe2 cells.
Original language | American English |
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Pages | 271-274 |
Number of pages | 4 |
State | Published - 1994 |
Externally published | Yes |
Event | Proceedings of the 24th IEEE Photovoltaic Specialists Conference. Part 2 (of 2) - Waikoloa, HI, USA Duration: 5 Dec 1994 → 9 Dec 1994 |
Conference
Conference | Proceedings of the 24th IEEE Photovoltaic Specialists Conference. Part 2 (of 2) |
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City | Waikoloa, HI, USA |
Period | 5/12/94 → 9/12/94 |
Bibliographical note
Work performed by Colorado State University, Fort Collins, ColoradoNREL Publication Number
- NREL/CP-20106