Effect of Thin Film Module Geometry on Solar Cell Current-Voltage Analysis

I. L. Eisgruber, J. R. Sites

Research output: Contribution to conferencePaperpeer-review

5 Scopus Citations

Abstract

Extraction of diode quality factor and series resistance from current-voltage data may be complicated by voltage drops across the transparent conducting oxide. The effect of the voltage drops on IV analysis is negligible for small cells, but becomes important for larger cells such as those found in thin-film modules. Agreement between predicted and measured voltage drops is demonstrated. Numerical results are presented for CdTe and CuInSe2 cells.

Original languageAmerican English
Pages271-274
Number of pages4
StatePublished - 1994
Externally publishedYes
EventProceedings of the 24th IEEE Photovoltaic Specialists Conference. Part 2 (of 2) - Waikoloa, HI, USA
Duration: 5 Dec 19949 Dec 1994

Conference

ConferenceProceedings of the 24th IEEE Photovoltaic Specialists Conference. Part 2 (of 2)
CityWaikoloa, HI, USA
Period5/12/949/12/94

Bibliographical note

Work performed by Colorado State University, Fort Collins, Colorado

NREL Publication Number

  • NREL/CP-20106

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