Abstract
We experimentally demonstrate an intrinsic statistical effect of the phenomenon of spontaneous ordering in semiconductor alloys: the reduction of alloy fluctuations as a function of the order parameter, as reflected in the exciton linewidth. A theoretical model is presented to qualitatively describe the dependence of the exciton linewidth on the order parameter.
Original language | American English |
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Pages (from-to) | 9910-9912 |
Number of pages | 3 |
Journal | Physical Review B - Condensed Matter and Materials Physics |
Volume | 61 |
Issue number | 15 |
DOIs | |
State | Published - 2000 |
NREL Publication Number
- NREL/JA-590-28686