Abstract
We experimentally demonstrate an intrinsic statistical effect of the phenomenon of spontaneous ordering in semiconductor alloys: the reduction of alloy fluctuations as a function of the order parameter, as reflected in the exciton linewidth. A theoretical model is presented to qualitatively describe the dependence of the exciton linewidth on the order parameter.
| Original language | American English |
|---|---|
| Pages (from-to) | 9910-9912 |
| Number of pages | 3 |
| Journal | Physical Review B - Condensed Matter and Materials Physics |
| Volume | 61 |
| Issue number | 15 |
| DOIs | |
| State | Published - 2000 |
NLR Publication Number
- NREL/JA-590-28686