Abstract
The approach in this subcontract was to use unique analytical tools available at Berkeley to perform systematic fundamental physical studies of the distribution and chemical state of metal clusters in a variety of multicrystalline silicon materials. Two analytical techniques were essential for the success of this project. The total metal concentration in the areas of multicrystalline silicon withhigh and low lifetime was determined by neutron activation analysis, a technique that involves irradiation of a sample with neutrons in a nuclear reactor and analysis of its residual radioactivity. The distribution and chemical state of metal clusters was characterized by synchrotron radiation-based X-ray microscopes available at the Advanced Light Source (Beamlines 10.3.1 and 10.3.2) atLawrence Berkeley National Laboratory and Advanced Photon Source (Beamlines 2-ID-D and 20-ID-B) at Argonne National Laboratory.
| Original language | American English |
|---|---|
| Number of pages | 31 |
| State | Published - 2005 |
Bibliographical note
Work performed by the University of California at Berkeley, Berkeley, CaliforniaNREL Publication Number
- NREL/SR-520-37578
Keywords
- float-zone (FZ)
- in-situ
- manufacturer
- metal clusters
- microprobe x-ray fluorescence (mu-XRF)
- module
- multicrystalline silicon
- PV
- solar cells
- synchrotron radiation
- x-ray absorption microspectroscopy (mu-XAS)
- x-ray-beam-induced current measurements (XBIC)