Abstract
We improved the efficiency of ultra-thin (0.49-μm-thick) Cu(In,Ga)Se2 solar cells to 15.2% (officially measured). To achieve these results, we modified growth conditions from the 3-stage process but did not add post-deposition treatments or additional material layers. The increase in device efficiency is attributed to a steeper Ga gradient in the CIGS with higher Ga content near the Mo back contact, which can hinder electron-hole recombination at the interface. We discuss device measurements and film characterization for ultra-thin CIGS. Modeling is presented that shows the route to even higher efficiencies for devices with CIGS thicknesses of 0.5 μm.
Original language | American English |
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Pages (from-to) | 949-954 |
Number of pages | 6 |
Journal | Progress in Photovoltaics: Research and Applications |
Volume | 26 |
Issue number | 11 |
DOIs | |
State | Published - 2018 |
Bibliographical note
Publisher Copyright:Copyright © 2018 John Wiley & Sons, Ltd.
NREL Publication Number
- NREL/JA-5K00-70468
Keywords
- Cu(In,Ga)Se (CIGS)
- current-voltage characteristics
- photovoltaic cells
- semiconductor device modeling
- thin films