EFG Manufacturing Line Technical Progress and Module Cost Reductions under the PVMaT Program

EFG Manufacturing Line Technical Progress and Module Cost Reductions under the PVMaT Program

Research output: Contribution to conference › Paper

Original language	American English
Pages	196-197
Number of pages	2
State	Published - 1997
Event	Seventh Workshop on the Role of Impurities and Defects in Silicon Device Processing - Vail, Colorado Duration: 11 Aug 1997 → 13 Aug 1997

Conference

Conference	Seventh Workshop on the Role of Impurities and Defects in Silicon Device Processing
City	Vail, Colorado
Period	11/08/97 → 13/08/97

Bibliographical note

Work performed by ASE Americas, Inc., Billerica, Massachusetts

NREL Publication Number

NREL/CP-23617

Cite this

@conference{f070dbb93f74463c840c6c7873011cb4,

title = "EFG Manufacturing Line Technical Progress and Module Cost Reductions under the PVMaT Program",

author = "NREL",

note = "Work performed by ASE Americas, Inc., Billerica, Massachusetts; Seventh Workshop on the Role of Impurities and Defects in Silicon Device Processing ; Conference date: 11-08-1997 Through 13-08-1997",

year = "1997",

language = "American English",

pages = "196--197",

}

TY - CONF

T1 - EFG Manufacturing Line Technical Progress and Module Cost Reductions under the PVMaT Program

AU - NREL, null

N1 - Work performed by ASE Americas, Inc., Billerica, Massachusetts

PY - 1997

Y1 - 1997

M3 - Paper

SP - 196

EP - 197

T2 - Seventh Workshop on the Role of Impurities and Defects in Silicon Device Processing

Y2 - 11 August 1997 through 13 August 1997

ER -