Electrical and Compositional Characterization of Gallium Grading in Cu(In,Ga)Se2 Solar Cells

Bradley West, Harvey Guthrey, Lei Chen, April Jeffries, Simone Bernardini, Barry Lai, Jörg Maser, William Shafarman, Mowafak Al-Jasim, Mariana Bertoni

Research output: Contribution to conferencePaperpeer-review

2 Scopus Citations

Abstract

Cu(In,Ga)Se2 (CIGS) solar cells were characterized in cross section using electron beam induced current (EBIC) and synchrotron based x-ray fluorescence (XRF) measurements. Samples with varying gallium ratios and growth methods were compared. A correlation was observed between the compositional gallium grading profile from XRF and carrier activity seen in EBIC through the thickness of the CIGS layer. Samples with steep back grading showed carrier activity isolated near the CIGS/CdS interface, whereas a more uniform grading resulted in carrier activity seen throughout the absorber layer. 'Notch' grading showed only slight variation in EBIC profile compared to a back graded sample with similar gallium ratios.

Original languageAmerican English
Pages1726-1728
Number of pages3
DOIs
StatePublished - 15 Oct 2014
Event40th IEEE Photovoltaic Specialist Conference, PVSC 2014 - Denver, United States
Duration: 8 Jun 201413 Jun 2014

Conference

Conference40th IEEE Photovoltaic Specialist Conference, PVSC 2014
Country/TerritoryUnited States
CityDenver
Period8/06/1413/06/14

Bibliographical note

Publisher Copyright:
© 2014 IEEE.

NREL Publication Number

  • NREL/CP-5K00-63760

Keywords

  • band gap grading
  • chalcopyrite
  • CIGS
  • EBIC
  • synchrotron
  • thin film
  • x-ray fluorescence

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