Electrical Characterization of Printed Nanocrystalline Silicon Films, Cooperative Research and Development Final Report, CRADA Number CRD-07-00241

David Young

doi:10.2172/1013908

Electrical Characterization of Printed Nanocrystalline Silicon Films, Cooperative Research and Development Final Report, CRADA Number CRD-07-00241

David Young

Chemistry and Nanoscience

Research output: NREL › Technical Report

Abstract

This CRADA helped Innovalight characterize and quantify their ink-based selective emitter technology. Controlled localized doping of selective emitter structures via Innovalight Silicon Ink technology was demonstrated. Both secondary ion mass spectrometry and scanning capacitance microscopy revealed; abrupt lateral dopant profiles at ink-printed boundaries. Uniform doping of iso- and pyramidalsurfaces was also verified using scanning electron microscopy dopant contrast imaging.

Original language	American English
Number of pages	8
DOIs	https://doi.org/10.2172/1013908
State	Published - 2011

NREL Publication Number

NREL/TP-7A10-50944

Keywords

CRADAS
electrical characterization of printed nanocrystalline silicon films
Innovalight

Access to Document

10.2172/1013908

https://www.nrel.gov/docs/fy11osti/50944.pdf

Cite this

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abstract = "This CRADA helped Innovalight characterize and quantify their ink-based selective emitter technology. Controlled localized doping of selective emitter structures via Innovalight Silicon Ink technology was demonstrated. Both secondary ion mass spectrometry and scanning capacitance microscopy revealed; abrupt lateral dopant profiles at ink-printed boundaries. Uniform doping of iso- and pyramidalsurfaces was also verified using scanning electron microscopy dopant contrast imaging.",

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AB - This CRADA helped Innovalight characterize and quantify their ink-based selective emitter technology. Controlled localized doping of selective emitter structures via Innovalight Silicon Ink technology was demonstrated. Both secondary ion mass spectrometry and scanning capacitance microscopy revealed; abrupt lateral dopant profiles at ink-printed boundaries. Uniform doping of iso- and pyramidalsurfaces was also verified using scanning electron microscopy dopant contrast imaging.

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KW - electrical characterization of printed nanocrystalline silicon films

KW - Innovalight

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Electrical Characterization of Printed Nanocrystalline Silicon Films, Cooperative Research and Development Final Report, CRADA Number CRD-07-00241

Abstract

NREL Publication Number

Keywords

Access to Document

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Cite this