Electrical Charge Trapping at Defects on the Si(111)7x7 Surface: Article No. 061909

Research output: Contribution to journalArticlepeer-review

Original languageAmerican English
Number of pages3
JournalApplied Physics Letters
Volume88
Issue number6
DOIs
StatePublished - 2006

NREL Publication Number

  • NREL/JA-520-38842

Keywords

  • defects
  • disordered domains
  • electron trapping
  • Kelvin probe force microscopy (KPFM)
  • scanning tunneling microscopy (STM)

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