Abstract
One of the core issues in all of the photovoltaics technologies is relating PV device performance to the methods and materials used to produce them. Due to the nature of PV devices, the electronic and optical properties of the materials are key to device performance. The relationship between materials growth and processing, the resulting electro-optical properties, and device performance can beextremely complex and difficult to determine without direct measurement of these properties. Accurate and timely measurement of the electro-optical properties as a function of device processing provides researchers and manufacturers with the knowledge they need to troubleshoot problems and develop the knowledge base necessary for reducing cost, maximizing efficiency, improving reliability, andenhancing manufacturability. The Electro-optical Characterization Team at NREL provides this support for all internal and external projects funded by the PV Program.
| Original language | American English |
|---|---|
| Number of pages | 5 |
| State | Published - 2005 |
| Event | 2005 DOE Solar Energy Technologies Program Review Meeting - Denver, Colorado Duration: 7 Nov 2005 → 10 Nov 2005 |
Conference
| Conference | 2005 DOE Solar Energy Technologies Program Review Meeting |
|---|---|
| City | Denver, Colorado |
| Period | 7/11/05 → 10/11/05 |
Bibliographical note
Presented at the 2005 DOE Solar Energy Technologies Program Review Meeting held November 7-10, 2005 in Denver, Colorado. Also included in the proceedings available on CD-ROM (DOE/GO-102006-2245; NREL/CD-520-38557)NREL Publication Number
- NREL/CP-520-38948
Keywords
- electro-optical characterization
- NREL
- photovoltaics (PV)
- PV
- solar