Electro-Optical Characterization at NREL

Research output: Contribution to conferencePaper

Abstract

One of the core issues in all of the photovoltaics technologies is relating PV device performance to the methods and materials used to produce them. Due to the nature of PV devices, the electronic and optical properties of the materials are key to device performance. The relationship between materials growth and processing, the resulting electro-optical properties, and device performance can beextremely complex and difficult to determine without direct measurement of these properties. Accurate and timely measurement of the electro-optical properties as a function of device processing provides researchers and manufacturers with the knowledge they need to troubleshoot problems and develop the knowledge base necessary for reducing cost, maximizing efficiency, improving reliability, andenhancing manufacturability. The Electro-optical Characterization Team at NREL provides this support for all internal and external projects funded by the PV Program.
Original languageAmerican English
Number of pages5
StatePublished - 2005
Event2005 DOE Solar Energy Technologies Program Review Meeting - Denver, Colorado
Duration: 7 Nov 200510 Nov 2005

Conference

Conference2005 DOE Solar Energy Technologies Program Review Meeting
CityDenver, Colorado
Period7/11/0510/11/05

Bibliographical note

Presented at the 2005 DOE Solar Energy Technologies Program Review Meeting held November 7-10, 2005 in Denver, Colorado. Also included in the proceedings available on CD-ROM (DOE/GO-102006-2245; NREL/CD-520-38557)

NREL Publication Number

  • NREL/CP-520-38948

Keywords

  • electro-optical characterization
  • NREL
  • photovoltaics (PV)
  • PV
  • solar

Fingerprint

Dive into the research topics of 'Electro-Optical Characterization at NREL'. Together they form a unique fingerprint.

Cite this