Abstract
This brochure presents the capabilities that the Measurements and Characterization Division has in Electro-Optical Characterization, in which a variety of spectroscopy, ellipsometry, and capacitance techniques are used to probe the fundamental electrical and optical properties of solid-state materials.
| Original language | American English |
|---|---|
| Number of pages | 8 |
| State | Published - 2000 |
NREL Publication Number
- NREL/BR-530-22214
Other Report Number
- DOE/GO-10099-802