Abstract
The electrochemical deposition of mesostructured vanadium oxides and vanadophosphates was investigated by using X-ray diffraction analysis. The composition of the mesostructured materials were analyzed by using X-ray photoelectron spectroscopy (XPS). It was found that the isotropical mesostructure were advantageous when it is employed as catalysts.
Original language | American English |
---|---|
Pages (from-to) | 489-490 |
Number of pages | 2 |
Journal | Journal of Materials Science Letters |
Volume | 22 |
Issue number | 6 |
DOIs | |
State | Published - 2003 |
NREL Publication Number
- NREL/JA-590-34446