Electrochemical Photocapacitance Spectroscopy Method for Characterization of Deep Levels and Interface States in Semiconductor Materials

    Research output: Contribution to journalArticle

    Original languageAmerican English
    Pages (from-to)275-283
    Number of pages9
    JournalJournal of the Electrochemical Society
    Issue number2
    StatePublished - 1984

    Bibliographical note

    Work performed by Rockwell International Science Center, Thousand Oaks, California

    NREL Publication Number

    • ACNR/JA-3956

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