Electrochemical Screening of Contact Layers for Metal Halide Perovskites

Moses Kodur, Zachary Dorfman, Ross Kerner, Justin Skaggs, Taewoo Kim, Sean Dunfield, Axel Palmstrom, Joseph Berry, David Fenning

Research output: Contribution to journalArticlepeer-review

5 Scopus Citations


Optimizing selective contact layers in photovoltaics is necessary to yield high-performing stable devices. However, this has been difficult for perovskites due to their complex interfacial defects that affect carrier concentrations in the active layer and charge transfer and recombination at the interface. Using vacuum thermally evaporated tin oxide as a case study, we highlight electrochemical tests that are simple yet screen device-relevant contact layer properties, making them useful for process development and quality control. Specifically, we show that cyclic voltammetry and potentiostatic chronoamperometry correlate to key performance parameters in completed devices and other material/interfacial properties relevant to devices such as shunt pathways and chemical composition. Having fast, reliable, scalable, and actionable probes of electronic properties is increasingly important as halide perovskite photovoltaics approach their theoretical limits and scale to large-area devices.

Original languageAmerican English
Pages (from-to)683-689
Number of pages7
JournalACS Energy Letters
Issue number2
StatePublished - 2022

Bibliographical note

Publisher Copyright:
© 2022 American Chemical Society

NREL Publication Number

  • NREL/JA-5900-80761


  • electrochemistry
  • halide perovskite
  • tin oxide
  • vapor deposition


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