Electroluminescence Mapping of CuGaSe2 Solar Cells by Atomic Force Microscopy

Manuel J. Romero; C. S. Jiang; J. Abushama; H. R. Moutinho; M. M. Al-Jassim; R. Noufi

doi:10.1063/1.2360230

Electroluminescence Mapping of CuGaSe2 Solar Cells by Atomic Force Microscopy

Manuel J. Romero, C. S. Jiang, J. Abushama, H. R. Moutinho, M. M. Al-Jassim, R. Noufi

Materials Science

National Renewable Energy Laboratory

Research output: Contribution to journal › Article › peer-review

14 Scopus Citations

Abstract

The authors report on the observation of electroluminescence (EL) in CuGa Se2 solar cells using tapping-mode atomic force microscopy based on tuning-fork sensors. Individually injected current pulses are seen during intermittent contact driven by an external bias applied to the conducting tip. It follows that EL can be stimulated when the solar cell is forward biased during the contact cycle. Local L-V characteristics show evidence for EL, with a threshold voltage of 3.0-3.7 V. Mapping of the photon emission suggests that grain boundaries effectively isolate grain interiors, which behave as individual light-emitting diodes.

Original language	American English
Article number	143120
Number of pages	3
Journal	Applied Physics Letters
Volume	89
Issue number	14
DOIs	https://doi.org/10.1063/1.2360230 https://doi.org/10.1063/1.2360230
State	Published - 2006

NREL Publication Number

NREL/JA-520-40361

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title = "Electroluminescence Mapping of CuGaSe2 Solar Cells by Atomic Force Microscopy",

abstract = "The authors report on the observation of electroluminescence (EL) in CuGa Se2 solar cells using tapping-mode atomic force microscopy based on tuning-fork sensors. Individually injected current pulses are seen during intermittent contact driven by an external bias applied to the conducting tip. It follows that EL can be stimulated when the solar cell is forward biased during the contact cycle. Local L-V characteristics show evidence for EL, with a threshold voltage of 3.0-3.7 V. Mapping of the photon emission suggests that grain boundaries effectively isolate grain interiors, which behave as individual light-emitting diodes.",

author = "Romero, {Manuel J.} and Jiang, {C. S.} and J. Abushama and Moutinho, {H. R.} and Al-Jassim, {M. M.} and R. Noufi",

year = "2006",

doi = "10.1063/1.2360230",

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volume = "89",

journal = "Applied Physics Letters",

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AU - Romero, Manuel J.

AU - Jiang, C. S.

AU - Abushama, J.

AU - Moutinho, H. R.

AU - Al-Jassim, M. M.

AU - Noufi, R.

PY - 2006

Y1 - 2006

N2 - The authors report on the observation of electroluminescence (EL) in CuGa Se2 solar cells using tapping-mode atomic force microscopy based on tuning-fork sensors. Individually injected current pulses are seen during intermittent contact driven by an external bias applied to the conducting tip. It follows that EL can be stimulated when the solar cell is forward biased during the contact cycle. Local L-V characteristics show evidence for EL, with a threshold voltage of 3.0-3.7 V. Mapping of the photon emission suggests that grain boundaries effectively isolate grain interiors, which behave as individual light-emitting diodes.

AB - The authors report on the observation of electroluminescence (EL) in CuGa Se2 solar cells using tapping-mode atomic force microscopy based on tuning-fork sensors. Individually injected current pulses are seen during intermittent contact driven by an external bias applied to the conducting tip. It follows that EL can be stimulated when the solar cell is forward biased during the contact cycle. Local L-V characteristics show evidence for EL, with a threshold voltage of 3.0-3.7 V. Mapping of the photon emission suggests that grain boundaries effectively isolate grain interiors, which behave as individual light-emitting diodes.

UR - http://www.scopus.com/inward/record.url?scp=33749486264&partnerID=8YFLogxK

U2 - 10.1063/1.2360230

DO - 10.1063/1.2360230

M3 - Article

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SN - 0003-6951

VL - 89

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 14

M1 - 143120

ER -

Electroluminescence Mapping of CuGaSe2 Solar Cells by Atomic Force Microscopy

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