Electron-Beam-Induced Current Decay Measurements in Electron Probe Instruments Using a Multichannel Analyzer

Research output: Contribution to journal › Article

Original language	American English
Pages (from-to)	509-511
Number of pages	3
Journal	Journal of Electron Microscopy Technique
Volume	2
Issue number	5
DOIs	https://doi.org/10.1002/jemt.1060020513
State	Published - 1985

NREL Publication Number

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title = "Electron-Beam-Induced Current Decay Measurements in Electron Probe Instruments Using a Multichannel Analyzer",

author = "NREL",

year = "1985",

doi = "10.1002/jemt.1060020513",

language = "American English",

volume = "2",

pages = "509--511",

journal = "Journal of Electron Microscopy Technique",

issn = "0741-0581",

publisher = "Wiley-Liss Inc.",

number = "5",

}

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AU - NREL, null

PY - 1985

Y1 - 1985

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DO - 10.1002/jemt.1060020513

M3 - Article

SN - 0741-0581

VL - 2

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EP - 511

JO - Journal of Electron Microscopy Technique

JF - Journal of Electron Microscopy Technique

IS - 5

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