Electron Microscope Characterization of MOCVD-Grown GaP Layers on Si

NREL

    Research output: Contribution to conference › Paper

    Original languageAmerican English
    Pages724-725
    Number of pages2
    StatePublished - 1986
    Event44th Annual Meeting of the Electron Microscopy Society of America - Albuquerque, New Mexico
    Duration: 10 Aug 1986 → 15 Aug 1986

    Conference

    Conference44th Annual Meeting of the Electron Microscopy Society of America
    CityAlbuquerque, New Mexico
    Period10/08/86 → 15/08/86

    NREL Publication Number

    • ACNR/CP-213-7765

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