Electron Microscopy Study of Individual Grain Boundaries in Cu2ZnSnSe4 Thin Films

Zhiwei Wang; Kim M. Jones; Andrew G. Norman; John Moseley; Ingrid L. Repins; Rommel Noufi; Yanfa Yan; Mowafak M. Al-Jassim

doi:10.1109/PVSC.2013.6744468

Electron Microscopy Study of Individual Grain Boundaries in Cu2ZnSnSe4 Thin Films

Zhiwei Wang, Kim M. Jones, Andrew G. Norman, John Moseley, Ingrid L. Repins, Rommel Noufi, Yanfa Yan, Mowafak M. Al-Jassim

Research output: Contribution to conference › Paper › peer-review

1 Scopus Citations

Abstract

We study the structural, chemical, and electronic properties of individual grain boundaries in Cu₂ZnSnSe₄ (CZTSe) using combined electron microscopy techniques including scanning electron microscopy-based cathodoluminescence (CL)-spectrum imaging and scanning transmission electron microscopy-based Z-contrast imaging and energy-dispersive spectroscopy profiling. Two representative grain boundaries have been studied. We find that the grain boundary that exhibits a redshift in the CL spectrum image is found to link to a ZnSe second phase. The grain boundary showing no redshift in the CL spectrum image is not linked to any secondary phase. The stability of CZTSe cross-section samples with storage time is also discussed.

Original language	American English
Pages	1681-1684
Number of pages	4
DOIs	https://doi.org/10.1109/PVSC.2013.6744468 https://doi.org/10.1109/PVSC.2013.6744468
State	Published - 2013
Event	39th IEEE Photovoltaic Specialists Conference, PVSC 2013 - Tampa, FL, United States Duration: 16 Jun 2013 → 21 Jun 2013

Conference

Conference	39th IEEE Photovoltaic Specialists Conference, PVSC 2013
Country/Territory	United States
City	Tampa, FL
Period	16/06/13 → 21/06/13

NREL Publication Number

NREL/CP-5200-57856

Keywords

Cathodoluminescence
Electron microscopy
Grain boundary
Polycrystalline thin film

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Wang, Z., Jones, K. M., Norman, A. G., Moseley, J., Repins, I. L., Noufi, R., Yan, Y., & Al-Jassim, M. M. (2013). Electron Microscopy Study of Individual Grain Boundaries in Cu2ZnSnSe4 Thin Films. 1681-1684. Paper presented at 39th IEEE Photovoltaic Specialists Conference, PVSC 2013, Tampa, FL, United States. https://doi.org/10.1109/PVSC.2013.6744468, https://doi.org/10.1109/PVSC.2013.6744468

@conference{65ba9de7c2264930905790bffed4ea64,

title = "Electron Microscopy Study of Individual Grain Boundaries in Cu2ZnSnSe4 Thin Films",

abstract = "We study the structural, chemical, and electronic properties of individual grain boundaries in Cu2ZnSnSe4 (CZTSe) using combined electron microscopy techniques including scanning electron microscopy-based cathodoluminescence (CL)-spectrum imaging and scanning transmission electron microscopy-based Z-contrast imaging and energy-dispersive spectroscopy profiling. Two representative grain boundaries have been studied. We find that the grain boundary that exhibits a redshift in the CL spectrum image is found to link to a ZnSe second phase. The grain boundary showing no redshift in the CL spectrum image is not linked to any secondary phase. The stability of CZTSe cross-section samples with storage time is also discussed.",

keywords = "Cathodoluminescence, Electron microscopy, Grain boundary, Polycrystalline thin film",

author = "Zhiwei Wang and Jones, {Kim M.} and Norman, {Andrew G.} and John Moseley and Repins, {Ingrid L.} and Rommel Noufi and Yanfa Yan and Al-Jassim, {Mowafak M.}",

year = "2013",

doi = "10.1109/PVSC.2013.6744468",

language = "American English",

pages = "1681--1684",

note = "39th IEEE Photovoltaic Specialists Conference, PVSC 2013 ; Conference date: 16-06-2013 Through 21-06-2013",

}

Wang, Z, Jones, KM, Norman, AG, Moseley, J, Repins, IL, Noufi, R, Yan, Y & Al-Jassim, MM 2013, 'Electron Microscopy Study of Individual Grain Boundaries in Cu2ZnSnSe4 Thin Films', Paper presented at 39th IEEE Photovoltaic Specialists Conference, PVSC 2013, Tampa, FL, United States, 16/06/13 - 21/06/13 pp. 1681-1684. https://doi.org/10.1109/PVSC.2013.6744468, https://doi.org/10.1109/PVSC.2013.6744468

TY - CONF

T1 - Electron Microscopy Study of Individual Grain Boundaries in Cu2ZnSnSe4 Thin Films

AU - Wang, Zhiwei

AU - Jones, Kim M.

AU - Norman, Andrew G.

AU - Moseley, John

AU - Repins, Ingrid L.

AU - Noufi, Rommel

AU - Yan, Yanfa

AU - Al-Jassim, Mowafak M.

PY - 2013

Y1 - 2013

N2 - We study the structural, chemical, and electronic properties of individual grain boundaries in Cu2ZnSnSe4 (CZTSe) using combined electron microscopy techniques including scanning electron microscopy-based cathodoluminescence (CL)-spectrum imaging and scanning transmission electron microscopy-based Z-contrast imaging and energy-dispersive spectroscopy profiling. Two representative grain boundaries have been studied. We find that the grain boundary that exhibits a redshift in the CL spectrum image is found to link to a ZnSe second phase. The grain boundary showing no redshift in the CL spectrum image is not linked to any secondary phase. The stability of CZTSe cross-section samples with storage time is also discussed.

AB - We study the structural, chemical, and electronic properties of individual grain boundaries in Cu2ZnSnSe4 (CZTSe) using combined electron microscopy techniques including scanning electron microscopy-based cathodoluminescence (CL)-spectrum imaging and scanning transmission electron microscopy-based Z-contrast imaging and energy-dispersive spectroscopy profiling. Two representative grain boundaries have been studied. We find that the grain boundary that exhibits a redshift in the CL spectrum image is found to link to a ZnSe second phase. The grain boundary showing no redshift in the CL spectrum image is not linked to any secondary phase. The stability of CZTSe cross-section samples with storage time is also discussed.

KW - Cathodoluminescence

KW - Electron microscopy

KW - Grain boundary

KW - Polycrystalline thin film

UR - http://www.scopus.com/inward/record.url?scp=84896468010&partnerID=8YFLogxK

U2 - 10.1109/PVSC.2013.6744468

DO - 10.1109/PVSC.2013.6744468

M3 - Paper

AN - SCOPUS:84896468010

SP - 1681

EP - 1684

T2 - 39th IEEE Photovoltaic Specialists Conference, PVSC 2013

Y2 - 16 June 2013 through 21 June 2013

ER -

Electron Microscopy Study of Individual Grain Boundaries in Cu2ZnSnSe4 Thin Films

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