Electron Time-of-Flight Measurements in a-Si1-xCx:H

Electron Time-of-Flight Measurements in a-Si1-xCx:H

Research output: Contribution to conference › Paper

Original language	American English
Pages	419-424
Number of pages	6
State	Published - 1993
Event	Amorphous Silicon Technology - 1993: Materials Research Society Symposium - San Francisco, California Duration: 13 Apr 1993 → 16 Apr 1993

Conference

Conference	Amorphous Silicon Technology - 1993: Materials Research Society Symposium
City	San Francisco, California
Period	13/04/93 → 16/04/93

Bibliographical note

Work performed by Syracuse University, Syracuse, New York and Solarex Corporation, Newtown, Pennsylvania

NREL Publication Number

ACNR/CP-14390

Cite this

@conference{0c3e1b4df6f64f73a3874ede271b1bff,

title = "Electron Time-of-Flight Measurements in a-Si1-xCx:H",

author = "NREL",

note = "Work performed by Syracuse University, Syracuse, New York and Solarex Corporation, Newtown, Pennsylvania; Amorphous Silicon Technology - 1993: Materials Research Society Symposium ; Conference date: 13-04-1993 Through 16-04-1993",

year = "1993",

language = "American English",

pages = "419--424",

}