Electron Traps Detected in p-type GaAsN Using Deep Level Transient Spectroscopy

Research output: Contribution to conferencePaper

Abstract

The GaAsN alloy can have a band gap as small as 1.0 eV when the nitrogen composition is about 2%. Indium can also be added to the alloy to increase lattice matching to GaAs and Ge. These properties are advantageous for developing a highly-efficient, multi-junction solar cell. However, poor GaAsN cell properties, such as low open-circuit voltage, have led to inadequate performance. Deep-leveltransient spectroscopy of p-type GaAsN has identified an electron trap having an activation energy near 0.2 eV and a trap density of at least 1016 cm-3. This trap level appears with the addition of small amounts of nitrogen to GaAs, which also corresponds to an increased drop in open-circuit voltage.
Original languageAmerican English
Number of pages5
StatePublished - 2005
Event2004 DOE Solar Energy Technologies Program Review Meeting - Denver, Colorado
Duration: 25 Oct 200428 Oct 2004

Conference

Conference2004 DOE Solar Energy Technologies Program Review Meeting
CityDenver, Colorado
Period25/10/0428/10/04

Bibliographical note

Presented at the 2004 DOE Solar Energy Technologies Program Review Meeting, 25-28 October 2004, Denver, Colorado. Also included in the proceedings available on CD-ROM (DOE/GO-102005-2067; NREL/CD-520-37140)

NREL Publication Number

  • NREL/CP-520-37021

Keywords

  • concentrator modules
  • deep level transient spectroscopy (DLTS)
  • electron traps
  • electron traps
  • lattice matching
  • nitrogen composition
  • open-circuit voltages
  • PV

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