Electronic and Magnetic Properties of Interstitial 3d Impurities in Silicon

Electronic and Magnetic Properties of Interstitial 3d Impurities in Silicon

Research output: Contribution to conference › Paper

Original language	American English
Pages	111-116
Number of pages	6
State	Published - 1985
Event	Microscopic Identification of Electronic Defects in Semiconductors: Materials Research Society Symposium - San Francisco, California Duration: 15 Apr 1985 → 18 Apr 1985

Conference

Conference	Microscopic Identification of Electronic Defects in Semiconductors: Materials Research Society Symposium
City	San Francisco, California
Period	15/04/85 → 18/04/85

NREL Publication Number

ACNR/CP-212-6871

Cite this

@conference{dc6b666a8f6847dbb3f0946e9a3cc7eb,

title = "Electronic and Magnetic Properties of Interstitial 3d Impurities in Silicon",

author = "NREL",

year = "1985",

language = "American English",

pages = "111--116",

note = "Microscopic Identification of Electronic Defects in Semiconductors: Materials Research Society Symposium ; Conference date: 15-04-1985 Through 18-04-1985",

}