Abstract
The electronic band alignment of the Zn(O,S)/Cu(In,Ga)Se2 interface in high-efficiency thin-film solar cells was derived using X-ray photoelectron spectroscopy, ultra-violet photoelectron spectroscopy, and inverse photoemission spectroscopy. Similar to the CdS/Cu(In,Ga)Se2 system, we find an essentially flat (small-spike) conduction band alignment (here: a conduction band offset of (0.09 ± 0.20) eV), allowing for largely unimpeded electron transfer and forming a likely basis for the success of high-efficiency Zn(O,S)-based chalcopyrite devices. Furthermore, we find evidence for multiple bonding environments of Zn and O in the Zn(O,S) film, including ZnO, ZnS, Zn(OH)2, and possibly ZnSe.
Original language | American English |
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Pages (from-to) | 1142-1148 |
Number of pages | 7 |
Journal | Progress in Photovoltaics: Research and Applications |
Volume | 24 |
Issue number | 8 |
DOIs | |
State | Published - 2016 |
Bibliographical note
Publisher Copyright:Copyright © 2016 John Wiley & Sons, Ltd.
NREL Publication Number
- NREL/JA-5K00-66194
Keywords
- alternative buffer layers
- band alignment
- chalcopyrite thin-film solar cell
- inverse photoemission
- X-ray spectroscopy
- Zn(O,S)