Electronic Structure Study of N, O Related Defects in GaP for Photoelectrochemical Applications

Muhammad N. Huda, Todd G. Deutsch, Pranab Sarker, John A. Turner

Research output: Contribution to journalArticlepeer-review

2 Scopus Citations

Fingerprint

Dive into the research topics of 'Electronic Structure Study of N, O Related Defects in GaP for Photoelectrochemical Applications'. Together they form a unique fingerprint.

Material Science