Electroreflectance and Photoreflectance Characterization of the Space Charge Region in Semiconductors: ITO/InP as a Model System

Electroreflectance and Photoreflectance Characterization of the Space Charge Region in Semiconductors: ITO/InP as a Model System

Research output: Contribution to conference › Paper

Original language	American English
Pages	81-87
Number of pages	7
State	Published - 1987
Event	Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices - Bay Point, Florida Duration: 26 Mar 1987 → 27 Mar 1987

Conference

Conference	Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices
City	Bay Point, Florida
Period	26/03/87 → 27/03/87

Bibliographical note

Work performed by Phyics Department, Brooklyn College of CUNY, Brooklyn, New York and Solar Energy Research Institute, Golden, Colorado

NREL Publication Number

ACNR/CP-213-9539

Cite this

@conference{fb764888175547e3ad2df6d69505dd16,

title = "Electroreflectance and Photoreflectance Characterization of the Space Charge Region in Semiconductors: ITO/InP as a Model System",

author = "NREL",

note = "Work performed by Phyics Department, Brooklyn College of CUNY, Brooklyn, New York and Solar Energy Research Institute, Golden, Colorado; Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices ; Conference date: 26-03-1987 Through 27-03-1987",

year = "1987",

language = "American English",

pages = "81--87",

}

TY - CONF

T1 - Electroreflectance and Photoreflectance Characterization of the Space Charge Region in Semiconductors: ITO/InP as a Model System

AU - NREL, null

N1 - Work performed by Phyics Department, Brooklyn College of CUNY, Brooklyn, New York and Solar Energy Research Institute, Golden, Colorado

PY - 1987

Y1 - 1987

M3 - Paper

SP - 81

EP - 87

T2 - Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices

Y2 - 26 March 1987 through 27 March 1987

ER -