Elemental and Magnetic Sensitive Imaging Using X-Ray Excited Luminescence Microscopy

R. A. Rosenberg; S. Zohar; D. Keavney; R. Divan; D. Rosenmann; A. Mascarenhas; M. A. Steiner

doi:10.1063/1.4730335

Elemental and Magnetic Sensitive Imaging Using X-Ray Excited Luminescence Microscopy

R. A. Rosenberg, S. Zohar, D. Keavney, R. Divan, D. Rosenmann, A. Mascarenhas, M. A. Steiner

Chemistry and Nanoscience

Research output: Contribution to journal › Article › peer-review

9 Scopus Citations

Abstract

We demonstrate the potential of x-ray excited luminescence microscopy for full-field elemental and magnetic sensitive imaging using a commercially available optical microscope, mounted on preexisting synchrotron radiation (SR) beamline end stations. The principal components of the instrument will be described. Bench top measurements indicate that a resolution of 1 μm or better is possible; this value was degraded in practice due to vibrations andor drift in the end station and associated manipulator. X-ray energy dependent measurements performed on model solar cell materials and lithographically patterned magnetic thin film structures reveal clear elemental and magnetic signatures. The merits of the apparatus will be discussed in terms of conventional SR imaging techniques.

Original language	American English
Article number	073701
Number of pages	6
Journal	Review of Scientific Instruments
Volume	83
Issue number	7
DOIs	https://doi.org/10.1063/1.4730335 https://doi.org/10.1063/1.4730335
State	Published - Jul 2012

NREL Publication Number

NREL/JA-5900-55399

Keywords

lithographically patterned
magnetic signatures
model solar cell

Access to Document

Cite this

@article{0c8a513fb2ea4445b876fa0f9fcf3008,

title = "Elemental and Magnetic Sensitive Imaging Using X-Ray Excited Luminescence Microscopy",

abstract = "We demonstrate the potential of x-ray excited luminescence microscopy for full-field elemental and magnetic sensitive imaging using a commercially available optical microscope, mounted on preexisting synchrotron radiation (SR) beamline end stations. The principal components of the instrument will be described. Bench top measurements indicate that a resolution of 1 μm or better is possible; this value was degraded in practice due to vibrations andor drift in the end station and associated manipulator. X-ray energy dependent measurements performed on model solar cell materials and lithographically patterned magnetic thin film structures reveal clear elemental and magnetic signatures. The merits of the apparatus will be discussed in terms of conventional SR imaging techniques.",

keywords = "lithographically patterned, magnetic signatures, model solar cell",

author = "Rosenberg, {R. A.} and S. Zohar and D. Keavney and R. Divan and D. Rosenmann and A. Mascarenhas and Steiner, {M. A.}",

year = "2012",

month = jul,

doi = "10.1063/1.4730335",

language = "American English",

volume = "83",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics",

number = "7",

}

TY - JOUR

T1 - Elemental and Magnetic Sensitive Imaging Using X-Ray Excited Luminescence Microscopy

AU - Rosenberg, R. A.

AU - Zohar, S.

AU - Keavney, D.

AU - Divan, R.

AU - Rosenmann, D.

AU - Mascarenhas, A.

AU - Steiner, M. A.

PY - 2012/7

Y1 - 2012/7

N2 - We demonstrate the potential of x-ray excited luminescence microscopy for full-field elemental and magnetic sensitive imaging using a commercially available optical microscope, mounted on preexisting synchrotron radiation (SR) beamline end stations. The principal components of the instrument will be described. Bench top measurements indicate that a resolution of 1 μm or better is possible; this value was degraded in practice due to vibrations andor drift in the end station and associated manipulator. X-ray energy dependent measurements performed on model solar cell materials and lithographically patterned magnetic thin film structures reveal clear elemental and magnetic signatures. The merits of the apparatus will be discussed in terms of conventional SR imaging techniques.

AB - We demonstrate the potential of x-ray excited luminescence microscopy for full-field elemental and magnetic sensitive imaging using a commercially available optical microscope, mounted on preexisting synchrotron radiation (SR) beamline end stations. The principal components of the instrument will be described. Bench top measurements indicate that a resolution of 1 μm or better is possible; this value was degraded in practice due to vibrations andor drift in the end station and associated manipulator. X-ray energy dependent measurements performed on model solar cell materials and lithographically patterned magnetic thin film structures reveal clear elemental and magnetic signatures. The merits of the apparatus will be discussed in terms of conventional SR imaging techniques.

KW - lithographically patterned

KW - magnetic signatures

KW - model solar cell

UR - http://www.scopus.com/inward/record.url?scp=84866870818&partnerID=8YFLogxK

U2 - 10.1063/1.4730335

DO - 10.1063/1.4730335

M3 - Article

AN - SCOPUS:84866870818

SN - 0034-6748

VL - 83

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 7

M1 - 073701

ER -

Elemental and Magnetic Sensitive Imaging Using X-Ray Excited Luminescence Microscopy

Abstract

NREL Publication Number

Keywords

Access to Document

Other files and links

Fingerprint

Cite this