Ellipsometry of Randomly Rough Oxidized Silicon Surfaces

doi:10.1016/0379-6787(84)90007-3

Ellipsometry of Randomly Rough Oxidized Silicon Surfaces

Research output: Contribution to journal › Article

Original language	American English
Pages (from-to)	179-183
Number of pages	5
Journal	Solar Cells
Volume	13
Issue number	2
DOIs	https://doi.org/10.1016/0379-6787(84)90007-3
State	Published - 1984

Bibliographical note

Work performed by Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts; Department of Electrical Engineering and Computer Science, Princeton University, Princeton, New Jersey; Solar Energy Research Institute, Golden, Colorado

NREL Publication Number

ACNR/JA-212-6424

Access to Document

10.1016/0379-6787(84)90007-3

Cite this

@article{33da8b41fb144fb49e4863fd00dd90ba,

title = "Ellipsometry of Randomly Rough Oxidized Silicon Surfaces",

author = "NREL",

note = "Work performed by Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts; Department of Electrical Engineering and Computer Science, Princeton University, Princeton, New Jersey; Solar Energy Research Institute, Golden, Colorado",

year = "1984",

doi = "10.1016/0379-6787(84)90007-3",

language = "American English",

volume = "13",

pages = "179--183",

journal = "Solar Cells",

issn = "0379-6787",

publisher = "Elsevier BV",

number = "2",

}

TY - JOUR

T1 - Ellipsometry of Randomly Rough Oxidized Silicon Surfaces

AU - NREL, null

N1 - Work performed by Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts; Department of Electrical Engineering and Computer Science, Princeton University, Princeton, New Jersey; Solar Energy Research Institute, Golden, Colorado

PY - 1984

Y1 - 1984

U2 - 10.1016/0379-6787(84)90007-3

DO - 10.1016/0379-6787(84)90007-3

M3 - Article

SN - 0379-6787

VL - 13

SP - 179

EP - 183

JO - Solar Cells

JF - Solar Cells

IS - 2

ER -