Ellipsometry of Thin Silicon Dioxide Films on Rough Polycrystalline Silicon Surfaces: (Abstract)

Research output: Contribution to journal › Article

NREL Publication Number

@article{430c16b601844b6983f6916fdd02b925,

title = "Ellipsometry of Thin Silicon Dioxide Films on Rough Polycrystalline Silicon Surfaces: (Abstract)",

author = "NREL",

year = "1980",

doi = "10.1016/0379-6787(80)90075-7",

language = "American English",

volume = "1",

journal = "Solar Cells",

issn = "0379-6787",

publisher = "Elsevier B.V.",

number = "3",

}