Elucidating PID Degradation Mechanisms and In Situ Dark I-V Monitoring for Modeling Degradation Rate in CdTe Thin-Film Modules

Peter Hacke, Sergiu Spataru, Steve Johnston, Kent Terwilliger, Kaitlyn Vansant, Michael Kempe, John Wohlgemuth, Sarah Kurtz, Anders Olsson, Michelle Propst

Research output: Contribution to journalArticlepeer-review

29 Scopus Citations

Fingerprint

Dive into the research topics of 'Elucidating PID Degradation Mechanisms and In Situ Dark I-V Monitoring for Modeling Degradation Rate in CdTe Thin-Film Modules'. Together they form a unique fingerprint.

Engineering

Biochemistry, Genetics and Molecular Biology

Material Science

Immunology and Microbiology