Empirical Correlation for Minority Carrier Lifetime to Defect Density Profile in Germanium on Silicon Grown by Nanoscale Interfacial Engineering

Josephine J. Sheng, Darin Leonhardt, Sang M. Han, Steven W. Johnston, Jeffrey G. Cederberg, Malcolm S. Carroll

Research output: Contribution to journal › Article › peer-review

15 Scopus Citations

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Material Science