Employing Weibull Analysis and Weakest Link Theory to Resolve Crystalline Silicon PV Cell Strength Between Bare Cells and Reduced- and Full-Sized Modules

Nick Bosco, Martin Springer, Jiqi Liu, Sameera Venkat, Roger French

Research output: Contribution to journalArticlepeer-review

8 Scopus Citations

Abstract

Weibull analysis and weakest link theory are employed to resolve the probability of crystalline silicon PV cell fracture when measured as bare cells and when stressed in reduced- and full-sized modules. Experimental results indicated that the characteristic cell strength is reduced by ∼20% once packaged into the laminate of a one-cell module and loaded in four-point flexure (4PF). This experimental observation was shown consistent with a weakest link theory prediction that the strength limiting flaws reside on the surface of the cell's edge. The analysis is ultimately extended to present the equivalent loading of four-cell modules by uniform pressure and 4PF and a uniformly loaded full-sized module and demonstrates that smaller, representative, modules must be loaded to a much higher level than their parent full-sized modules to achieve an equivalent probability for cell fracture.

Original languageAmerican English
Article number9364348
Pages (from-to)731-741
Number of pages11
JournalIEEE Journal of Photovoltaics
Volume11
Issue number3
DOIs
StatePublished - May 2021

Bibliographical note

Publisher Copyright:
© 2011-2012 IEEE.

NREL Publication Number

  • NREL/JA-5K00-78131

Keywords

  • Modeling
  • Photovoltaic (PV) cells
  • Reliability
  • Statistical analysis
  • Surface cracks
  • Weibull distribution

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