Abstract
Weibull analysis and weakest link theory are employed to resolve the probability of crystalline silicon PV cell fracture when measured as bare cells and when stressed in reduced- and full-sized modules. Experimental results indicated that the characteristic cell strength is reduced by ∼20% once packaged into the laminate of a one-cell module and loaded in four-point flexure (4PF). This experimental observation was shown consistent with a weakest link theory prediction that the strength limiting flaws reside on the surface of the cell's edge. The analysis is ultimately extended to present the equivalent loading of four-cell modules by uniform pressure and 4PF and a uniformly loaded full-sized module and demonstrates that smaller, representative, modules must be loaded to a much higher level than their parent full-sized modules to achieve an equivalent probability for cell fracture.
Original language | American English |
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Article number | 9364348 |
Pages (from-to) | 731-741 |
Number of pages | 11 |
Journal | IEEE Journal of Photovoltaics |
Volume | 11 |
Issue number | 3 |
DOIs | |
State | Published - May 2021 |
Bibliographical note
Publisher Copyright:© 2011-2012 IEEE.
NREL Publication Number
- NREL/JA-5K00-78131
Keywords
- Modeling
- Photovoltaic (PV) cells
- Reliability
- Statistical analysis
- Surface cracks
- Weibull distribution