Abstract
We demonstrate coincident-site lattice-matched growth of InGaAs layers on (001) MgAl2O4 spinel substrates, using a 45° rotation between the lattices, by molecular beam epitaxy. This is the first step towards easily removable multijunction solar cells with inert, reusable substrates. High-resolution cross-sectional transmission electron microscopy (TEM) measurements indicate that microtwins originate at the InGaAs/spinel interface, but tend to annihilate leaving the upper parts of layers relatively twin-free. Plan-view TEM indicates a high density of threading dislocations. InGaAs layers grown at elevated temperatures show improved transport properties, with majority-carrier mobilities approaching typical values for homoepitaxial GaAs on GaAs substrates. Simple p-i-n junctions show photovoltaic efficiencies above 1%.
Original language | American English |
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Pages (from-to) | 40-43 |
Number of pages | 4 |
Journal | Journal of Crystal Growth |
Volume | 363 |
DOIs | |
State | Published - 2013 |
NREL Publication Number
- NREL/JA-5200-56681
Keywords
- A1. Planar defects
- A1. Substrates
- A3. Molecular beam epitaxy
- B2. Semiconducting III-V materials
- B3. Solar cells