Estimating and Controlling Chromatic Aberration Losses for Two-Junction, Two-Terminal Devices in Refractive Concentrator Systems

Sarah R. Kurtz; Mark J. O'Neill

doi:10.1109/PVSC.1996.564020

Estimating and Controlling Chromatic Aberration Losses for Two-Junction, Two-Terminal Devices in Refractive Concentrator Systems

Sarah R. Kurtz, Mark J. O'Neill

Materials Science

National Renewable Energy Laboratory

Research output: Contribution to conference › Paper › peer-review

59 Scopus Citations

Abstract

Although previous studies have measured and calculated chromatic aberration losses and proposed methods for reducing these by modifying the optics, significant work remains to be done toward understanding how to quantify the losses and how various parameters affect this loss. This paper presents an analytical definition and calculation method for chromatic aberration losses. The effects of sheet resistance of the midlayers of the cell, total irradiance, incident spectrum, cell width, and diode quality factor are studied. A method for measuring the midlayer resistance in finished cells is described.

Original language	American English
Pages	361-364
Number of pages	4
DOIs	https://doi.org/10.1109/PVSC.1996.564020 https://doi.org/10.1109/pvsc.1996.564020
State	Published - 1996
Event	Proceedings of the 1996 25th IEEE Photovoltaic Specialists Conference - Washington, DC, USA Duration: 13 May 1996 → 17 May 1996

Conference

Conference	Proceedings of the 1996 25th IEEE Photovoltaic Specialists Conference
City	Washington, DC, USA
Period	13/05/96 → 17/05/96

NREL Publication Number

NREL/CP-22381

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Kurtz, S. R., & O'Neill, M. J. (1996). Estimating and Controlling Chromatic Aberration Losses for Two-Junction, Two-Terminal Devices in Refractive Concentrator Systems. 361-364. Paper presented at Proceedings of the 1996 25th IEEE Photovoltaic Specialists Conference, Washington, DC, USA. https://doi.org/10.1109/PVSC.1996.564020, https://doi.org/10.1109/pvsc.1996.564020

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abstract = "Although previous studies have measured and calculated chromatic aberration losses and proposed methods for reducing these by modifying the optics, significant work remains to be done toward understanding how to quantify the losses and how various parameters affect this loss. This paper presents an analytical definition and calculation method for chromatic aberration losses. The effects of sheet resistance of the midlayers of the cell, total irradiance, incident spectrum, cell width, and diode quality factor are studied. A method for measuring the midlayer resistance in finished cells is described.",

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year = "1996",

doi = "10.1109/PVSC.1996.564020",

language = "American English",

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note = "Proceedings of the 1996 25th IEEE Photovoltaic Specialists Conference ; Conference date: 13-05-1996 Through 17-05-1996",

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Kurtz, SR & O'Neill, MJ 1996, 'Estimating and Controlling Chromatic Aberration Losses for Two-Junction, Two-Terminal Devices in Refractive Concentrator Systems', Paper presented at Proceedings of the 1996 25th IEEE Photovoltaic Specialists Conference, Washington, DC, USA, 13/05/96 - 17/05/96 pp. 361-364. https://doi.org/10.1109/PVSC.1996.564020, https://doi.org/10.1109/pvsc.1996.564020

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AB - Although previous studies have measured and calculated chromatic aberration losses and proposed methods for reducing these by modifying the optics, significant work remains to be done toward understanding how to quantify the losses and how various parameters affect this loss. This paper presents an analytical definition and calculation method for chromatic aberration losses. The effects of sheet resistance of the midlayers of the cell, total irradiance, incident spectrum, cell width, and diode quality factor are studied. A method for measuring the midlayer resistance in finished cells is described.

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M3 - Paper

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T2 - Proceedings of the 1996 25th IEEE Photovoltaic Specialists Conference

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Estimating and Controlling Chromatic Aberration Losses for Two-Junction, Two-Terminal Devices in Refractive Concentrator Systems

Abstract

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