Abstract
2 (CIGS) photovoltaic devices. In this study, temperature-dependent current voltage (JVT) and time-resolved photoluminescence (TRPL) experiments were combined with modeling using the solar cell capacitance simulator (SCAPS) computer code to investigate the effect of the RbF PDT. Two devices, one as-deposited and one with RbF PDT, were deposited by a three stage coevaporation process. JVT measurements suggest the dominant recombination mechanism may be tunneling-enhanced recombination via bandtail states, but that defect states in the bandgap can also be important. RbF PDT is shown to decrease the characteristic energy of the bandtails. TRPL data show an increase in the minority carrier lifetime after RbF PDT, leading to an improved open-circuit voltage. SCAPS modeling indicates that the dominant recombination mechanism is dependent on the specific defect makeup of a device, suggesting that small changes in processing conditions can impact device behavior. This explains the observation that, for some devices, defect states in the gap dominate while others, as is the case here, appear to be dominated by bandtails.
Original language | American English |
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Pages (from-to) | 1400-1405 |
Number of pages | 6 |
Journal | IEEE Journal of Photovoltaics |
Volume | 12 |
Issue number | 6 |
DOIs | |
State | Published - 2022 |
NREL Publication Number
- NREL/JA-5900-83601
Keywords
- characterization
- CIGS
- recombination
- thin film PV