Abstract
Because of the sensitivity of some photovoltaic devices to moisture-induced corrosion, they are packaged using impermeable front- and back-sheets along with an edge seal to prevent moisture ingress. Evaluation of edge seal materials can be difficult because of the low permeation rates involved and/or non-Fickian behavior. Here, using a Ca film deposited on a glass substrate, we demonstrate theevaluation of edge seal materials in a manner that effectively duplicates their use in a photovoltaic application and compare the results with standard methods for measuring water vapor transport. We demonstrate how moisture permeation data from polymer films can be used to estimate moisture ingress rates and compare the results of these two methods. Encapsulant materials were also evaluated forcomparison and to highlight the need for edge seals. Of the materials studied, desiccant filled polyisobutylene materials demonstrate by far the best potential to keep moisture out for a 20 to 30 year lifetime.
Original language | American English |
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Number of pages | 9 |
State | Published - 2011 |
Event | 35th IEEE Photovoltaic Specialists Conference (PVSC '10) - Honolulu, Hawaii Duration: 20 Jun 2010 → 25 Jun 2010 |
Conference
Conference | 35th IEEE Photovoltaic Specialists Conference (PVSC '10) |
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City | Honolulu, Hawaii |
Period | 20/06/10 → 25/06/10 |
NREL Publication Number
- NREL/CP-5200-47706
Keywords
- edge seal
- moisture ingress
- PV
- PV durability