Evaluation of Converter Performance Considering Static and Dynamic Device Part-to-Part Variability

Lee Gill, Michael Smith, Luke Yates, Gab-Su Seo, Alan Michaels

Research output: Contribution to conferencePaper

Abstract

This paper presents a methodology to incorporate and analyze the impact of semiconductor device part-to-part variation on power converter performance. By integrating extensive static and dynamic device characterization data with an automated compact model generation process that reflects manufacturing variability, device models with inherent variability features are utilized in converter simulations for a comprehensive assessment of performance impacts. The traditional converter performance evaluation process typically yields fixed efficiency values, often dismissing the inherent part-to-part variability caused by the manufacturing process of semiconductor devices. To address this limitation, a large population of devices was characterized to capture variations in static parameters-such as transfer, output, and capacitance characteristics-as well as dynamic behaviors, including switching losses. This data-driven approach enables the development of individual compact models, which were then integrated into converter simulations to evaluate efficiency ranges rather than single point estimated values. The converter simulation results show that part-to-part component variation can lead to significant efficiency deviations, exceeding several percentage points in high-power conversion applications. By offering a more accurate representation of converter behavior under real-world manufacturing conditions, this methodology enables designers to anticipate performance variability, improving the robustness of power converter designs.
Original languageAmerican English
Number of pages7
DOIs
StatePublished - 2024
Event2024 IEEE Design Methodologies Conference (DMC) - Grenoble, France
Duration: 18 Nov 202420 Nov 2024

Conference

Conference2024 IEEE Design Methodologies Conference (DMC)
CityGrenoble, France
Period18/11/2420/11/24

NREL Publication Number

  • NREL/CP-5D00-93590

Keywords

  • device characterization
  • manufacturing
  • modeling
  • part-to-part variation
  • performance analysis
  • variability

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