Abstract
Dynamic Mechanical Loading (DML) of photovoltaic modules is explored as a route to quickly fatigue copper interconnect ribbons. Results indicate that most of the interconnect ribbons may be strained through module mechanical loading to a level that will result in failure in a few hundred to thousands of cycles. Considering the speed at which DML may be applied, this translates into a few hours of testing. To evaluate the equivalence of DML to thermal cycling, parallel tests were conducted with thermal cycling. Preliminary analysis suggests that one +/-1 kPa DML cycle is roughly equivalent to one standard accelerated thermal cycle and approximately 175 of these cycles are equivalent to a 25-year exposure in Golden Colorado for the mechanism of module ribbon fatigue.
Original language | American English |
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Pages | 2484-2489 |
Number of pages | 6 |
DOIs | |
State | Published - 2014 |
Event | 29th European Photovoltaic Solar Energy Conference and Exhibition - Amsterdam, The Netherlands Duration: 22 Sep 2014 → 26 Sep 2014 |
Conference
Conference | 29th European Photovoltaic Solar Energy Conference and Exhibition |
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City | Amsterdam, The Netherlands |
Period | 22/09/14 → 26/09/14 |
Bibliographical note
See NREL/CP-5J00-62596 for preprintNREL Publication Number
- NREL/CP-5J00-61484
Keywords
- accelerated testing
- cell cracking
- dynamic mechanical loading
- fatigue
- thermal cycling