Evaluation of Four Imaging Techniques for the Electrical Characterization of Solar Cells: Preprint

Steven Johnston

Evaluation of Four Imaging Techniques for the Electrical Characterization of Solar Cells: Preprint

Materials Science

Research output: Contribution to conference › Paper

Abstract

The imaging techniques enable the possibility of higher-level quality control and defect analysis of solar cell materials in in-line production processes.

Original language	American English
Number of pages	9
State	Published - 2008
Event	2008 Materials Research Society (MRS) Fall Meeting - Boston, Massachusetts Duration: 30 Nov 2008 → 1 Dec 2008

Conference

Conference	2008 Materials Research Society (MRS) Fall Meeting
City	Boston, Massachusetts
Period	30/11/08 → 1/12/08

NREL Publication Number

NREL/CP-520-44607

Keywords

carrier diffusion length
carrier-density imaging
dark lock-in thermography shunt detection
electroluminescence imaging
imaging techniques
industry standards
minority-carrier lifetimes
photoluminescence imaging
PV
shunting
solar cells

Access to Document

https://www.nrel.gov/docs/fy09osti/44607.pdf

Cite this

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title = "Evaluation of Four Imaging Techniques for the Electrical Characterization of Solar Cells: Preprint",

abstract = "The imaging techniques enable the possibility of higher-level quality control and defect analysis of solar cell materials in in-line production processes.",

keywords = "carrier diffusion length, carrier-density imaging, dark lock-in thermography shunt detection, electroluminescence imaging, imaging techniques, industry standards, minority-carrier lifetimes, photoluminescence imaging, PV, shunting, solar cells",

author = "Steven Johnston",

year = "2008",

language = "American English",

note = "2008 Materials Research Society (MRS) Fall Meeting ; Conference date: 30-11-2008 Through 01-12-2008",

}

TY - CONF

T1 - Evaluation of Four Imaging Techniques for the Electrical Characterization of Solar Cells: Preprint

AU - Johnston, Steven

PY - 2008

Y1 - 2008

N2 - The imaging techniques enable the possibility of higher-level quality control and defect analysis of solar cell materials in in-line production processes.

AB - The imaging techniques enable the possibility of higher-level quality control and defect analysis of solar cell materials in in-line production processes.

KW - carrier diffusion length

KW - carrier-density imaging

KW - dark lock-in thermography shunt detection

KW - electroluminescence imaging

KW - imaging techniques

KW - industry standards

KW - minority-carrier lifetimes

KW - photoluminescence imaging

KW - PV

KW - shunting

KW - solar cells

M3 - Paper

T2 - 2008 Materials Research Society (MRS) Fall Meeting

Y2 - 30 November 2008 through 1 December 2008

ER -

Evaluation of Four Imaging Techniques for the Electrical Characterization of Solar Cells: Preprint

Abstract

Conference

NREL Publication Number

Keywords

Access to Document

Fingerprint

Cite this