Abstract
The imaging techniques enable the possibility of higher-level quality control and defect analysis of solar cell materials in in-line production processes.
| Original language | American English |
|---|---|
| Number of pages | 9 |
| State | Published - 2008 |
| Event | 2008 Materials Research Society (MRS) Fall Meeting - Boston, Massachusetts Duration: 30 Nov 2008 → 1 Dec 2008 |
Conference
| Conference | 2008 Materials Research Society (MRS) Fall Meeting |
|---|---|
| City | Boston, Massachusetts |
| Period | 30/11/08 → 1/12/08 |
NLR Publication Number
- NREL/CP-520-44607
Keywords
- carrier diffusion length
- carrier-density imaging
- dark lock-in thermography shunt detection
- electroluminescence imaging
- imaging techniques
- industry standards
- minority-carrier lifetimes
- photoluminescence imaging
- PV
- shunting
- solar cells
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