Evaluation of Four Imaging Techniques for the Electrical Characterization of Solar Cells (Presentation)

Research output: NRELPresentation

Abstract

The imaging techniques enable the possibility of higher-level quality control and defect analysis of solar cell materials in in-line production processes.
Original languageAmerican English
Number of pages27
StatePublished - 2008

Publication series

NamePrepared for the 2008 FAll MRS conference, November 30 - December 5, Boston, Massachusetts

NREL Publication Number

  • NREL/PR-520-44763

Keywords

  • carrier density imaging
  • carrier diffusion length
  • dark lock-in thermography shunt detection
  • electroluminescence imaging
  • minority-carrier lifetime
  • photoluminescence imaging
  • PV
  • shunts
  • solar cells

Fingerprint

Dive into the research topics of 'Evaluation of Four Imaging Techniques for the Electrical Characterization of Solar Cells (Presentation)'. Together they form a unique fingerprint.

Cite this