@misc{c90a197a3df14c928c8b1e8d2fbf64fc,
title = "Evaluation of Four Imaging Techniques for the Electrical Characterization of Solar Cells (Presentation)",
abstract = "The imaging techniques enable the possibility of higher-level quality control and defect analysis of solar cell materials in in-line production processes.",
keywords = "carrier density imaging, carrier diffusion length, dark lock-in thermography shunt detection, electroluminescence imaging, minority-carrier lifetime, photoluminescence imaging, PV, shunts, solar cells",
author = "Steven Johnston",
year = "2008",
language = "American English",
series = "Prepared for the 2008 FAll MRS conference, November 30 - December 5, Boston, Massachusetts",
type = "Other",
}