Evaluation of Four Imaging Techniques for the Electrical Characterization of Solar Cells: Paper No. 1123-P03-08

Research output: Contribution to conferencePaper

Original languageAmerican English
Pages151-156
Number of pages6
StatePublished - 2009
EventProceedings of the Materials Research Society Symposium - San Francisco, California
Duration: 2 Dec 20084 Dec 2008

Conference

ConferenceProceedings of the Materials Research Society Symposium
CitySan Francisco, California
Period2/12/084/12/08

NREL Publication Number

  • NREL/CP-520-47898

Keywords

  • defects
  • diffusion length
  • imaging techniques
  • minority carrier lifetime
  • solar cells

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