Evaluation of Four Imaging Techniques for the Electrical Characterization of Solar Cells: Paper No. 1123-P03-08

Research output: Contribution to conference › Paper

Original language	American English
Pages	151-156
Number of pages	6
State	Published - 2009
Event	Proceedings of the Materials Research Society Symposium - San Francisco, California Duration: 2 Dec 2008 → 4 Dec 2008

Conference	Proceedings of the Materials Research Society Symposium
City	San Francisco, California
Period	2/12/08 → 4/12/08

NREL Publication Number

@conference{4b69f42488274321a63400328f7fc57a,

title = "Evaluation of Four Imaging Techniques for the Electrical Characterization of Solar Cells: Paper No. 1123-P03-08",

keywords = "defects, diffusion length, imaging techniques, minority carrier lifetime, solar cells",

author = "NREL",

year = "2009",

language = "American English",

pages = "151--156",

note = "Proceedings of the Materials Research Society Symposium ; Conference date: 02-12-2008 Through 04-12-2008",

}

TY - CONF

T1 - Evaluation of Four Imaging Techniques for the Electrical Characterization of Solar Cells

T2 - Proceedings of the Materials Research Society Symposium

AU - NREL, null

PY - 2009

Y1 - 2009

KW - defects

KW - diffusion length

KW - imaging techniques

KW - minority carrier lifetime

KW - solar cells

M3 - Paper

SP - 151

EP - 156

Y2 - 2 December 2008 through 4 December 2008

ER -