Evaluation of the PID-s Susceptibility of Modules Encapsulated in Materials of Varying Resistivity

Peter Hacke, Brian Habersberger, Lisa Madenjian

Research output: Contribution to conferencePaperpeer-review

15 Scopus Citations

Abstract

A common mechanism of potential-induced degradation is by shunting (PID-s) in PV modules, usually associated with the transport of sodium ions (Na+ through the encapsulant and penetrating the front junction of solar cells under voltage stress. Encapsulants with high volume resistivity have been suggested as a potentially cost-effective solution to this degradation mechanism. In this work, we examine three polyolefin elastomer (POE) encapsulants with volume resistivity varying over two orders of magnitude (ranging from 9 \times 10 131 \times 10 16 )85 {circ}\mathrm {C}85% 1000 ()1 \times 10 13 cm. The independence of PID susceptibility with respect to the resistivity of the polyolefin is attributed to the impermeability of POEs to Na + ions. Specific ions (i.e., Na +), rather than charge-carrying species in general, are responsible for this degradation mechanism.

Original languageAmerican English
Pages3807-3809
Number of pages3
DOIs
StatePublished - 26 Nov 2018
Event7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - Waikoloa Village, United States
Duration: 10 Jun 201815 Jun 2018

Conference

Conference7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018
Country/TerritoryUnited States
CityWaikoloa Village
Period10/06/1815/06/18

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

NREL Publication Number

  • NREL/CP-5K00-72450

Keywords

  • conductivity
  • degradation
  • films
  • ions
  • photovoltaic cells
  • stress
  • testing

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