Evaluation of Tight-Binding Models for Deep Defect Level in Semiconductors

Research output: Contribution to journal › Article

NREL Publication Number

@article{98a0bab314fa4b369b5ecff1a0edc5e8,

title = "Evaluation of Tight-Binding Models for Deep Defect Level in Semiconductors",

author = "NREL",

year = "1982",

doi = "10.1103/PhysRevB.25.2781",

language = "American English",

volume = "25",

pages = "2781--2785",

journal = "Physical Review B",

issn = "0163-1829",

publisher = "American Institute of Physics",

number = "4",

}