Abstract
The PVScan 5000, developed by the National Renewable Energy Laboratory, maps several key performance parameters for completed solar cells and for the silicon wafers from which they are made. As this brief explains, common patterns revealed by the mapping of these parameters should show how crystalline defects affect the performance of finished cells.
Original language | American English |
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Number of pages | 6 |
State | Published - 1996 |
NREL Publication Number
- NREL/MK-336-8091