Evolution of Crystallinity in Mixed-Phase (a+..mu..c)-Si:H as Determined by Real Time Spectroscopic Ellipsometry

Mowafak Al-Jassim

Evolution of Crystallinity in Mixed-Phase (a+..mu..c)-Si:H as Determined by Real Time Spectroscopic Ellipsometry

Materials, Chemical, and Computational Science

Research output: Contribution to conference › Paper

Original language	American English
Pages	539-544
Number of pages	6
State	Published - 2003
Event	Amorphous and Nanocrystalline Silicon-Based Films 2003: Materials Research Society Symposium - San Francisco, California Duration: 22 Apr 2003 → 25 Apr 2003

Conference

Conference	Amorphous and Nanocrystalline Silicon-Based Films 2003: Materials Research Society Symposium
City	San Francisco, California
Period	22/04/03 → 25/04/03

NREL Publication Number

NREL/CP-520-36064

Cite this

@conference{65e93d5ea2994557ab261d5fecc2f258,

title = "Evolution of Crystallinity in Mixed-Phase (a+..mu..c)-Si:H as Determined by Real Time Spectroscopic Ellipsometry",

author = "Mowafak Al-Jassim",

year = "2003",

language = "American English",

pages = "539--544",

note = "Amorphous and Nanocrystalline Silicon-Based Films 2003: Materials Research Society Symposium ; Conference date: 22-04-2003 Through 25-04-2003",

}