Examining Light-Induced Degradation with Combined-Accelerated Stress Testing

Peter Hacke, Akash Kumar, Kent Terwilliger, Paul Ndione, Sergiu Spataru, Ashwini Pavgi, Kaushik Roy Choudhury, GovindaSamy TamizhMani

Research output: NRELPoster


While further understanding is sought, the results suggest that a module can show no degradation in performance through a qualification test light soak, (IEC 61215: 2021 MQT 19.1 requirement of 10 kW minimum on one side). Yet, such cells may degrade significantly by LID under conditions within the statistical extremes of the natural environment applied in combined-accelerated stress testing (CAST).
Original languageAmerican English
StatePublished - 2023

Publication series

NamePresented at the 30th Annual NREL Silicon Workshop, 30 July - 2 August 2023, Breckenridge, Colorado

NREL Publication Number

  • NREL/PO-5K00-87739


  • combined-accelerated stress testing
  • degradation
  • light-induced degradation
  • soak


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