@misc{75a7453df366447caf91975ac8fd9482,
title = "Examining Light-Induced Degradation with Combined-Accelerated Stress Testing",
abstract = "While further understanding is sought, the results suggest that a module can show no degradation in performance through a qualification test light soak, (IEC 61215: 2021 MQT 19.1 requirement of 10 kW minimum on one side). Yet, such cells may degrade significantly by LID under conditions within the statistical extremes of the natural environment applied in combined-accelerated stress testing (CAST).",
keywords = "combined-accelerated stress testing, degradation, light-induced degradation, soak",
author = "Peter Hacke and Akash Kumar and Kent Terwilliger and Paul Ndione and Sergiu Spataru and Ashwini Pavgi and Choudhury, {Kaushik Roy} and GovindaSamy TamizhMani",
year = "2023",
language = "American English",
series = "Presented at the 30th Annual NREL Silicon Workshop, 30 July - 2 August 2023, Breckenridge, Colorado",
type = "Other",
}