Excitons and Recombination in Photovoltaic Materials

Research output: Contribution to conferencePaper


High spatial resolution scanning confocal microscopy, combined with low-temperature (5K) photoluminescence (PL) spectroscopy, can be used to probe the spatial variations in the spectral properties of photovoltaic materials with sub-micron spatial resolution. We report on the successful demonstration of this technique applied to two particular photovoltaic systems: a partially ordered GaInP 2epilayer, and a released (exposing the CdTe/CdS interface) polycrystalline CdTe film.
Original languageAmerican English
Number of pages8
StatePublished - 1998
EventNational Center for Photovoltaics Program Review Meeting - Denver, Colorado
Duration: 8 Sep 199811 Sep 1998


ConferenceNational Center for Photovoltaics Program Review Meeting
CityDenver, Colorado

NREL Publication Number

  • NREL/CP-590-25693


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