Abstract
We investigate the local ionic motion in the absorber layer of perovskite solar cells using scanning thermo-ionic microscopy (STIM). STIM images of perovskite films show higher STIM amplitude at most of the grain boundaries due to higher ionic motion at those regions. The perovskite absorber layer of devices aged under blue (450 nm) light soaking shows higher amplitude in STIM signal compared to controls kept in dark storage. Such enhancement of STIM amplitude upon aging under light implies an increased concentration or diffusivity (or both) of mobile ionic species in stressed devices. Our results demonstrate the utilization of the STIM technique to assess and understand the intrinsic local ionic motion in perovskite absorbers for further advancement in device stability and functionality.
Original language | American English |
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Pages | 1629-1631 |
Number of pages | 3 |
DOIs | |
State | Published - 2024 |
Event | IEEE PVSC 52 - Seattle Duration: 9 Jun 2024 → 14 Jun 2024 |
Conference
Conference | IEEE PVSC 52 |
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City | Seattle |
Period | 9/06/24 → 14/06/24 |
NREL Publication Number
- NREL/CP-5K00-90507
Keywords
- aging
- films
- frequency measurement
- grain boundaries
- microscopy
- nanoscale devices
- perovskites
- photovoltaic cells
- photovoltaic systems
- reliability