@misc{04a39da51ce94e56864e14f662192d88,
title = "Extended Pulse-Powered Humidity-Freeze Cycling for Testing Module-Level Power Electronics",
abstract = "An EMI suppression capacitor (polypropylene film type) failed by 'popcorning' due to vapor outgassing in pulse powered humidity-freeze cycles. No shorts or shunts could be detected despite mildly corroded metallization visible in the failed capacitor. Humidity-freeze cycling is optimized to break into moisture barriers. However, further studies will be required on additional module level power electronic (MLPE) devices to optimize the stress testing for condensation to precipitate any weakness to short circuiting and other humidity/bias failure modes.",
keywords = "accelerated stress testing, durability, module level power electronics, reliability",
author = "Peter Hacke and Michael Kempe and Ingrid Repins and Miguel Rodriguez",
year = "2017",
language = "American English",
series = "Presented at the NREL/SNL/BNL PV Reliability Workshops, 28 February - 2 March 2017, Lakewood, Colorado",
type = "Other",
}