Abstract
PVSCAN is a versatile instrument that has many applications in the PV industry, including high-speed mapping of material and cell parameters such as defect density, reflectance, and LBIC response. Recently, the PV community has been interested in acquiring this instrument for material and cell analyses and for process monitoring. This paper explores various issues that arise in developing acommercial instrument such as PVSCAN. Emphasis is on the technical details of the ability to scan fast and the detrimental effects this fast scan can have on the image quality of various material/cell parameters
| Original language | American English |
|---|---|
| Number of pages | 10 |
| State | Published - 1999 |
| Event | Ninth Workshop on Crystalline Silicon Solar Cell Materials and Processes - Breckenridge, Colorado Duration: 9 Aug 1999 → 11 Aug 1999 |
Conference
| Conference | Ninth Workshop on Crystalline Silicon Solar Cell Materials and Processes |
|---|---|
| City | Breckenridge, Colorado |
| Period | 9/08/99 → 11/08/99 |
NREL Publication Number
- NREL/CP-520-26932